device failure การใช้

• Device failure requiring reimplantation is estimated to occur in 2.5-6 % of the time.
• Three or four have died, he said, but not because of device failure or stroke.
• Three or four had died, but not because of device failure or stroke, he said.
• Short circuits, overloading, mismatched loads, or device failure are the prime reasons for excessive current.
• This very activity causes the material in the contacts to degrade quickly, resulting in device failure.
• This activity causes the material in the contacts to degrade over time, ultimately resulting in device failure.
• Device mirroring and typical RAID are designed to handle a single device failure in the RAID group of devices.
• It is commonly utilized in device failure analysis laboratories to aid with yield enhancement, quality and reliability issues and customer returns.
• In 2006, there were 497 ( about 0.09 % ) cases in which candidates had to be given re-tests because of device failure.
• Various other errors which may occur during the open include directory update failures, un-permitted multiple connections, media failures, communication link failures and device failures.
• On the high end, the resulting increase in local power dissipation can lead to thermal runaway that may cause momentary or permanent device failure.
• Phosphorene devices are reported to maintain their function for weeks with encapsulation layer, whereas experience device failure within a week when exposed to ambient condition.
• Due to difficulties handling device failures and adding new stations to a network, token ring gained a reputation for being unreliable and difficult to upgrade.
• For homeowners, the eventual wear out or premature device failures will introduce potential damage to the roof tiles or shingles, property damage and other nuisances.
• The rate of complications is about 12 % for minor complications and 3 % for major complications; major complications include infections, facial paralysis, and device failure.
• Furthermore, proton beams expose devices to risk of total ionizing dose ( TID ) failure which can cloud proton testing results or result in pre-mature device failure.
• Such steps also could persuade patients of the need to let scientists retrieve and study their implants upon their death or, in the worst-case scenario, a device failure.
• In the long term though, this can cause device failure, but in less extreme cases it simply serves to alter a device s operating characteristics in noticeable ways.
• Parameters for the key exchange can be chosen to make the probability of failure in the key exchange very small; much less than the probability of undetectable garbles or device failures.
• COMPUTERS-HEALTH _ WASHINGTON _ The Senate Special Year 2000 Technology Problem Committee holds a hearing on medical device failures due to the year 2000 computer problem . ( Glass, Cox News Service ).